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Fluxon Pinning in Niobium Films
Resistive losses induced by the presence of trapped magnetic flux in niobium superconducting films have been studied using 1.5 GHz microwaves. They are measured to span a very broad spectrum depending on the film-substrate interface and on the gas used in the sputtering discharge. An interpretation...
| Autores principales: | , , , , |
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| Lenguaje: | eng |
| Publicado: |
2000
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/477071 |