Single event upset tests of an 80Mbit/s optical receiver

Detalles Bibliográficos
Autores principales: Faccio, F, Berger, G, Gill, K, Huhtinen, M, Marchioro, A, Moreira, P, Vasey, F
Lenguaje:eng
Publicado: CERN 2000
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1109/23.960360
https://dx.doi.org/10.5170/CERN-2000-010.245
http://cds.cern.ch/record/478877

Internet

https://dx.doi.org/10.1109/23.960360
https://dx.doi.org/10.5170/CERN-2000-010.245
http://cds.cern.ch/record/478877

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