Redundancy or GaAs? Two different approaches to solve the problem of SEU (Single Event Upset) in a digital optical link

Detalles Bibliográficos
Autores principales: Dinkespiler, B, Stroynowski, R, Xie, S, Ye, J, Andrieux, M L, Gallin-Martel, L, Lundqvist, J M, Pearce, M, Rydström, S, Rethore, F
Lenguaje:eng
Publicado: CERN 2000
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.5170/CERN-2000-010.250
http://cds.cern.ch/record/478878

Internet

https://dx.doi.org/10.5170/CERN-2000-010.250
http://cds.cern.ch/record/478878

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