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Redundancy or GaAs? Two different approaches to solve the problem of SEU (Single Event Upset) in a digital optical link
| Autores principales: | , , , , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
CERN
2000
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.5170/CERN-2000-010.250 http://cds.cern.ch/record/478878 |
| _version_ | 1780896774729236480 |
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| author | Dinkespiler, B Stroynowski, R Xie, S Ye, J Andrieux, M L Gallin-Martel, L Lundqvist, J M Pearce, M Rydström, S Rethore, F |
| author_facet | Dinkespiler, B Stroynowski, R Xie, S Ye, J Andrieux, M L Gallin-Martel, L Lundqvist, J M Pearce, M Rydström, S Rethore, F |
| author_sort | Dinkespiler, B |
| collection | CERN |
| id | cern-478878 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2000 |
| publisher | CERN |
| record_format | invenio |
| spelling | cern-4788782019-09-30T06:29:59Zdoi:10.5170/CERN-2000-010.250http://cds.cern.ch/record/478878engDinkespiler, BStroynowski, RXie, SYe, JAndrieux, M LGallin-Martel, LLundqvist, J MPearce, MRydström, SRethore, FRedundancy or GaAs? Two different approaches to solve the problem of SEU (Single Event Upset) in a digital optical linkDetectors and Experimental TechniquesCERNoai:cds.cern.ch:4788782000 |
| spellingShingle | Detectors and Experimental Techniques Dinkespiler, B Stroynowski, R Xie, S Ye, J Andrieux, M L Gallin-Martel, L Lundqvist, J M Pearce, M Rydström, S Rethore, F Redundancy or GaAs? Two different approaches to solve the problem of SEU (Single Event Upset) in a digital optical link |
| title | Redundancy or GaAs? Two different approaches to solve the problem of SEU (Single Event Upset) in a digital optical link |
| title_full | Redundancy or GaAs? Two different approaches to solve the problem of SEU (Single Event Upset) in a digital optical link |
| title_fullStr | Redundancy or GaAs? Two different approaches to solve the problem of SEU (Single Event Upset) in a digital optical link |
| title_full_unstemmed | Redundancy or GaAs? Two different approaches to solve the problem of SEU (Single Event Upset) in a digital optical link |
| title_short | Redundancy or GaAs? Two different approaches to solve the problem of SEU (Single Event Upset) in a digital optical link |
| title_sort | redundancy or gaas? two different approaches to solve the problem of seu (single event upset) in a digital optical link |
| topic | Detectors and Experimental Techniques |
| url | https://dx.doi.org/10.5170/CERN-2000-010.250 http://cds.cern.ch/record/478878 |
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