Single event effect measurements on the resistive plate chambers front-end chips for the CMS experiment

Detalles Bibliográficos
Autores principales: Abbrescia, M, Colaleo, A, Iaselli, Giuseppe, Loddo, F, Maggi, M, Marangelli, B, Natali, S, Nuzzo, S, Pugliese, G M, Ranieri, A, Romano, F, Altieri, S, Belli, G, Bruno, G, Guida, R, Ratti, S P, Riccardi, C, Torre, P, Vitulo, P
Lenguaje:eng
Publicado: CERN 2000
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.5170/CERN-2000-010.255
http://cds.cern.ch/record/478879

Internet

https://dx.doi.org/10.5170/CERN-2000-010.255
http://cds.cern.ch/record/478879

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