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Use of external resistor to prevent radiation induced latch-up in commercial CMOS IC's

Detalles Bibliográficos
Autores principales:	Skorobogatov, P K, Nikiforov, A Y, Demidov, A A
Lenguaje:	eng
Publicado:	CERN 2000
Materias:	Detectors and Experimental Techniques
Acceso en línea:	https://dx.doi.org/10.5170/CERN-2000-010.496 http://cds.cern.ch/record/479719

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