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The secondary electron yield of TiZr and TiZrV non evaporable getter thin film coatings
The secondary electron yield (SEY) of two different non evaporable getter (NEG) samples has been measured 'as received' and after thermal treatment. The investigated NEGs are TiZr and TiZrV thin film coatings of 1 mm thickness, which are sputter deposited onto copper substrates. The maximu...
| Autores principales: | , , , |
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| Lenguaje: | eng |
| Publicado: |
2000
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1016/S0169-4332(00)00838-2 http://cds.cern.ch/record/480261 |