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Accelerated testing: statistical models, test plans, and data analyses

Detalles Bibliográficos
Autor principal: Nelson, Wayne
Lenguaje:eng
Publicado: Wiley 1990
Materias:
Acceso en línea:http://cds.cern.ch/record/500318
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author Nelson, Wayne
author_facet Nelson, Wayne
author_sort Nelson, Wayne
collection CERN
id cern-500318
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1990
publisher Wiley
record_format invenio
spelling cern-5003182021-04-22T02:54:49Zhttp://cds.cern.ch/record/500318engNelson, WayneAccelerated testing: statistical models, test plans, and data analysesMathematical Physics and MathematicsWileyoai:cds.cern.ch:5003181990
spellingShingle Mathematical Physics and Mathematics
Nelson, Wayne
Accelerated testing: statistical models, test plans, and data analyses
title Accelerated testing: statistical models, test plans, and data analyses
title_full Accelerated testing: statistical models, test plans, and data analyses
title_fullStr Accelerated testing: statistical models, test plans, and data analyses
title_full_unstemmed Accelerated testing: statistical models, test plans, and data analyses
title_short Accelerated testing: statistical models, test plans, and data analyses
title_sort accelerated testing: statistical models, test plans, and data analyses
topic Mathematical Physics and Mathematics
url http://cds.cern.ch/record/500318
work_keys_str_mv AT nelsonwayne acceleratedtestingstatisticalmodelstestplansanddataanalyses