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Noise characterization of a 0.25 $\mu$ m CMOS technology for the LHC experiments
After having reviewed the main noise sources in an MOS transistor the paper presents results about the noise performance of a 0.25 mu m CMOS technology which is being extensively used to design radiation tolerant ASICs for the LHC experiments (the Large Hadron Collider at present under construction...
| Autores principales: | , , , |
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| Lenguaje: | eng |
| Publicado: |
2001
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1016/S0168-9002(00)00761-0 http://cds.cern.ch/record/503755 |