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Noise characterization of a 0.25 $\mu$ m CMOS technology for the LHC experiments

After having reviewed the main noise sources in an MOS transistor the paper presents results about the noise performance of a 0.25 mu m CMOS technology which is being extensively used to design radiation tolerant ASICs for the LHC experiments (the Large Hadron Collider at present under construction...

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Detalles Bibliográficos
Autores principales:	Anelli, G, Faccio, F, Florian, S, Jarron, Pierre
Lenguaje:	eng
Publicado:	2001
Materias:	Detectors and Experimental Techniques
Acceso en línea:	https://dx.doi.org/10.1016/S0168-9002(00)00761-0 http://cds.cern.ch/record/503755

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