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Ionizing radiation effects in MOS devices and circuits

Detalles Bibliográficos
Autores principales: Dressendorfer, Paul V, Ma, T P
Lenguaje:eng
Publicado: Wiley 1989
Materias:
Acceso en línea:http://cds.cern.ch/record/515119
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author Dressendorfer, Paul V
Ma, T P
author_facet Dressendorfer, Paul V
Ma, T P
author_sort Dressendorfer, Paul V
collection CERN
id cern-515119
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1989
publisher Wiley
record_format invenio
spelling cern-5151192021-04-22T02:52:50Zhttp://cds.cern.ch/record/515119engDressendorfer, Paul VMa, T PIonizing radiation effects in MOS devices and circuitsEngineeringWileyoai:cds.cern.ch:5151191989
spellingShingle Engineering
Dressendorfer, Paul V
Ma, T P
Ionizing radiation effects in MOS devices and circuits
title Ionizing radiation effects in MOS devices and circuits
title_full Ionizing radiation effects in MOS devices and circuits
title_fullStr Ionizing radiation effects in MOS devices and circuits
title_full_unstemmed Ionizing radiation effects in MOS devices and circuits
title_short Ionizing radiation effects in MOS devices and circuits
title_sort ionizing radiation effects in mos devices and circuits
topic Engineering
url http://cds.cern.ch/record/515119
work_keys_str_mv AT dressendorferpaulv ionizingradiationeffectsinmosdevicesandcircuits
AT matp ionizingradiationeffectsinmosdevicesandcircuits