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Ionizing radiation effects in MOS devices and circuits
Autores principales: | , |
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Lenguaje: | eng |
Publicado: |
Wiley
1989
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/515119 |
_version_ | 1780897599438454784 |
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author | Dressendorfer, Paul V Ma, T P |
author_facet | Dressendorfer, Paul V Ma, T P |
author_sort | Dressendorfer, Paul V |
collection | CERN |
id | cern-515119 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 1989 |
publisher | Wiley |
record_format | invenio |
spelling | cern-5151192021-04-22T02:52:50Zhttp://cds.cern.ch/record/515119engDressendorfer, Paul VMa, T PIonizing radiation effects in MOS devices and circuitsEngineeringWileyoai:cds.cern.ch:5151191989 |
spellingShingle | Engineering Dressendorfer, Paul V Ma, T P Ionizing radiation effects in MOS devices and circuits |
title | Ionizing radiation effects in MOS devices and circuits |
title_full | Ionizing radiation effects in MOS devices and circuits |
title_fullStr | Ionizing radiation effects in MOS devices and circuits |
title_full_unstemmed | Ionizing radiation effects in MOS devices and circuits |
title_short | Ionizing radiation effects in MOS devices and circuits |
title_sort | ionizing radiation effects in mos devices and circuits |
topic | Engineering |
url | http://cds.cern.ch/record/515119 |
work_keys_str_mv | AT dressendorferpaulv ionizingradiationeffectsinmosdevicesandcircuits AT matp ionizingradiationeffectsinmosdevicesandcircuits |