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An introduction to surface analysis by XPS and AES
Autores principales: | , |
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Lenguaje: | eng |
Publicado: |
Wiley
2002
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/580981 |
_version_ | 1780899452643442688 |
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author | Watts, J F Wolstenholme, John |
author_facet | Watts, J F Wolstenholme, John |
author_sort | Watts, J F |
collection | CERN |
id | cern-580981 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2002 |
publisher | Wiley |
record_format | invenio |
spelling | cern-5809812021-04-22T02:43:08Zhttp://cds.cern.ch/record/580981engWatts, J FWolstenholme, JohnAn introduction to surface analysis by XPS and AESEngineeringWileyoai:cds.cern.ch:5809812002 |
spellingShingle | Engineering Watts, J F Wolstenholme, John An introduction to surface analysis by XPS and AES |
title | An introduction to surface analysis by XPS and AES |
title_full | An introduction to surface analysis by XPS and AES |
title_fullStr | An introduction to surface analysis by XPS and AES |
title_full_unstemmed | An introduction to surface analysis by XPS and AES |
title_short | An introduction to surface analysis by XPS and AES |
title_sort | introduction to surface analysis by xps and aes |
topic | Engineering |
url | http://cds.cern.ch/record/580981 |
work_keys_str_mv | AT wattsjf anintroductiontosurfaceanalysisbyxpsandaes AT wolstenholmejohn anintroductiontosurfaceanalysisbyxpsandaes AT wattsjf introductiontosurfaceanalysisbyxpsandaes AT wolstenholmejohn introductiontosurfaceanalysisbyxpsandaes |