Cargando…

An introduction to surface analysis by XPS and AES

Detalles Bibliográficos
Autores principales: Watts, J F, Wolstenholme, John
Lenguaje:eng
Publicado: Wiley 2002
Materias:
Acceso en línea:http://cds.cern.ch/record/580981
_version_ 1780899452643442688
author Watts, J F
Wolstenholme, John
author_facet Watts, J F
Wolstenholme, John
author_sort Watts, J F
collection CERN
id cern-580981
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2002
publisher Wiley
record_format invenio
spelling cern-5809812021-04-22T02:43:08Zhttp://cds.cern.ch/record/580981engWatts, J FWolstenholme, JohnAn introduction to surface analysis by XPS and AESEngineeringWileyoai:cds.cern.ch:5809812002
spellingShingle Engineering
Watts, J F
Wolstenholme, John
An introduction to surface analysis by XPS and AES
title An introduction to surface analysis by XPS and AES
title_full An introduction to surface analysis by XPS and AES
title_fullStr An introduction to surface analysis by XPS and AES
title_full_unstemmed An introduction to surface analysis by XPS and AES
title_short An introduction to surface analysis by XPS and AES
title_sort introduction to surface analysis by xps and aes
topic Engineering
url http://cds.cern.ch/record/580981
work_keys_str_mv AT wattsjf anintroductiontosurfaceanalysisbyxpsandaes
AT wolstenholmejohn anintroductiontosurfaceanalysisbyxpsandaes
AT wattsjf introductiontosurfaceanalysisbyxpsandaes
AT wolstenholmejohn introductiontosurfaceanalysisbyxpsandaes