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Transmission electron microscopy of semiconductor nanostructures: an analysis of composition and strain state
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| Lenguaje: | eng |
| Publicado: |
Springer
2003
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| Acceso en línea: | https://dx.doi.org/10.1007/3-540-36407-2 http://cds.cern.ch/record/608417 |
| _version_ | 1780900150264201216 |
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| author | Rosenauer, Andreas |
| author_facet | Rosenauer, Andreas |
| author_sort | Rosenauer, Andreas |
| collection | CERN |
| id | cern-608417 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2003 |
| publisher | Springer |
| record_format | invenio |
| spelling | cern-6084172021-04-22T02:40:09Zdoi:10.1007/3-540-36407-2http://cds.cern.ch/record/608417engRosenauer, AndreasTransmission electron microscopy of semiconductor nanostructures: an analysis of composition and strain stateMathematical Physics and MathematicsSpringeroai:cds.cern.ch:6084172003 |
| spellingShingle | Mathematical Physics and Mathematics Rosenauer, Andreas Transmission electron microscopy of semiconductor nanostructures: an analysis of composition and strain state |
| title | Transmission electron microscopy of semiconductor nanostructures: an analysis of composition and strain state |
| title_full | Transmission electron microscopy of semiconductor nanostructures: an analysis of composition and strain state |
| title_fullStr | Transmission electron microscopy of semiconductor nanostructures: an analysis of composition and strain state |
| title_full_unstemmed | Transmission electron microscopy of semiconductor nanostructures: an analysis of composition and strain state |
| title_short | Transmission electron microscopy of semiconductor nanostructures: an analysis of composition and strain state |
| title_sort | transmission electron microscopy of semiconductor nanostructures: an analysis of composition and strain state |
| topic | Mathematical Physics and Mathematics |
| url | https://dx.doi.org/10.1007/3-540-36407-2 http://cds.cern.ch/record/608417 |
| work_keys_str_mv | AT rosenauerandreas transmissionelectronmicroscopyofsemiconductornanostructuresananalysisofcompositionandstrainstate |