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Transmission electron microscopy of semiconductor nanostructures: an analysis of composition and strain state

Detalles Bibliográficos
Autor principal:	Rosenauer, Andreas
Lenguaje:	eng
Publicado:	Springer 2003
Materias:	Mathematical Physics and Mathematics
Acceso en línea:	https://dx.doi.org/10.1007/3-540-36407-2 http://cds.cern.ch/record/608417

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