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Advances in electron emission channeling measurements in semiconductors
This paper reports on recent advances in the application of electron emission channeling to studies of the lattice location of radioactive probe atoms in semiconductors. The introduction of position-sensitive electron detection has resulted in an improvement in the experimental efficiency of this me...
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| Lenguaje: | eng |
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2003
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| Acceso en línea: | https://dx.doi.org/10.1023/A:1012697429920 http://cds.cern.ch/record/638167 |