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Characterization and quality control of CMS silicon microstrip sensors
This paper presents the results of quality control tests performed on single-sided, pre-production silicon microstrip detectors for the compact muon solenoid silicon strip tracker. These tests included both a global and a strip-by-strip electrical characterization of the sensors. Additionally, all s...
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| Lenguaje: | eng |
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2003
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| Acceso en línea: | https://dx.doi.org/10.1016/S0168-9002(03)01038-6 http://cds.cern.ch/record/643237 |