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Radiation induced Single Event Effects in the ATLAS MDT-ASD front-end chip
Single Event Effect (SEE) tests of the MDT-ASD, the ATLAS MDT front-end chip have been performed at the Harvard Cyclotron Lab. The MDT-ASD is an 8-channel drift tube read-out ASIC fabricated in a commercial 0.5um CMOS process (AMOS14TB). The chip contains a 53 bit register which holds the setup info...
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
2002
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| Acceso en línea: | http://cds.cern.ch/record/681469 |