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The 2D Prototype of a Rotary X-Ray Tomograph for the ATLAS Semi-Conductor Tracker
Results are presented of precision tests with the prototype of an X-ray tomography system for measuring the two-dimensional position of silicon strip modules on barrel structures. The measured accuracy and repeatability are better than 6 micron in r*phi and better than 30 micron in r and are suffici...
| Autores principales: | , , , |
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| Lenguaje: | eng |
| Publicado: |
1999
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/683939 |