Cargando…
Lorentz angle variation with electric field for ATLAS silicon detectors
The material reported in this note has been presented at the Inner Detector general meeting during the February 2001 ATLAS week. Author from INFN and University of Milan. Lorentz angle in silicon detectors is computed from drift properties of charge carriers. It is found to be a strongly varying fun...
Autor principal: | Lari, T |
---|---|
Lenguaje: | eng |
Publicado: |
2001
|
Materias: | |
Acceso en línea: | http://cds.cern.ch/record/684187 |
Ejemplares similares
-
An algorithm for calculating the Lorentz angle in silicon detectors
por: Bartsch, V., et al.
Publicado: (2002) -
Determination of the Lorentz Angle in Microstrip Silicon Detectors with Cosmic Muons
por: Ciulli, Vitaliano, et al.
Publicado: (2007) -
Lorentz angle calibration for the barrel pixel detector
por: Wilke, Lotte, et al.
Publicado: (2008) -
A measurement of the Lorentz angle in silicon strip sensors at cryogenic temperature
por: Johnson, I, et al.
Publicado: (2005) -
The Lorentz angle in silicon detectors
por: de Boer, Wim
Publicado: (2001)