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Proton Induced Radiation Effects on a Xilinx FPGA and Estimates of SEE in the ATLAS Environment
We have measured the proton induced single-event upset cross-section of a Xilinx SRAM-based FPGA. Six XC4036XLA parts were irradiated with protons of energy between 18~MeV and 105~MeV using the Proton Irradiation Facility at TRIUMF. The saturation cross-section and threshold energy were determined t...
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
2001
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| Acceso en línea: | http://cds.cern.ch/record/684188 |