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Proton Induced Radiation Effects on a Xilinx FPGA and Estimates of SEE in the ATLAS Environment
We have measured the proton induced single-event upset cross-section of a Xilinx SRAM-based FPGA. Six XC4036XLA parts were irradiated with protons of energy between 18~MeV and 105~MeV using the Proton Irradiation Facility at TRIUMF. The saturation cross-section and threshold energy were determined t...
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Lenguaje: | eng |
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2001
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Acceso en línea: | http://cds.cern.ch/record/684188 |
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author | Buchanan, N J Gingrich, D M |
author_facet | Buchanan, N J Gingrich, D M |
author_sort | Buchanan, N J |
collection | CERN |
description | We have measured the proton induced single-event upset cross-section of a Xilinx SRAM-based FPGA. Six XC4036XLA parts were irradiated with protons of energy between 18~MeV and 105~MeV using the Proton Irradiation Facility at TRIUMF. The saturation cross-section and threshold energy were determined to be (2.7~$\pm$~0.2)$\times$10$^{-9}$~upset$\cdot$cm$^2$/device and (22~$\pm$~2)~MeV, respectively. Based on the behaviour of our test circuit, we have estimated the single-event upset cross-section for the circuit logic and the configuration switches of the FPGA separately. The upset cross-section was used to estimate the single-event upset rate in the ATLAS environment. An estimate of the proton induced latch-up rate in ATLAS was also made. |
id | cern-684188 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2001 |
record_format | invenio |
spelling | cern-6841882019-09-30T06:29:59Zhttp://cds.cern.ch/record/684188engBuchanan, N JGingrich, D MProton Induced Radiation Effects on a Xilinx FPGA and Estimates of SEE in the ATLAS EnvironmentDetectors and Experimental TechniquesWe have measured the proton induced single-event upset cross-section of a Xilinx SRAM-based FPGA. Six XC4036XLA parts were irradiated with protons of energy between 18~MeV and 105~MeV using the Proton Irradiation Facility at TRIUMF. The saturation cross-section and threshold energy were determined to be (2.7~$\pm$~0.2)$\times$10$^{-9}$~upset$\cdot$cm$^2$/device and (22~$\pm$~2)~MeV, respectively. Based on the behaviour of our test circuit, we have estimated the single-event upset cross-section for the circuit logic and the configuration switches of the FPGA separately. The upset cross-section was used to estimate the single-event upset rate in the ATLAS environment. An estimate of the proton induced latch-up rate in ATLAS was also made.ATL-LARG-2001-011oai:cds.cern.ch:6841882001-04-24 |
spellingShingle | Detectors and Experimental Techniques Buchanan, N J Gingrich, D M Proton Induced Radiation Effects on a Xilinx FPGA and Estimates of SEE in the ATLAS Environment |
title | Proton Induced Radiation Effects on a Xilinx FPGA and Estimates of SEE in the ATLAS Environment |
title_full | Proton Induced Radiation Effects on a Xilinx FPGA and Estimates of SEE in the ATLAS Environment |
title_fullStr | Proton Induced Radiation Effects on a Xilinx FPGA and Estimates of SEE in the ATLAS Environment |
title_full_unstemmed | Proton Induced Radiation Effects on a Xilinx FPGA and Estimates of SEE in the ATLAS Environment |
title_short | Proton Induced Radiation Effects on a Xilinx FPGA and Estimates of SEE in the ATLAS Environment |
title_sort | proton induced radiation effects on a xilinx fpga and estimates of see in the atlas environment |
topic | Detectors and Experimental Techniques |
url | http://cds.cern.ch/record/684188 |
work_keys_str_mv | AT buchanannj protoninducedradiationeffectsonaxilinxfpgaandestimatesofseeintheatlasenvironment AT gingrichdm protoninducedradiationeffectsonaxilinxfpgaandestimatesofseeintheatlasenvironment |