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Proton Induced Radiation Effects on a Xilinx FPGA and Estimates of SEE in the ATLAS Environment

We have measured the proton induced single-event upset cross-section of a Xilinx SRAM-based FPGA. Six XC4036XLA parts were irradiated with protons of energy between 18~MeV and 105~MeV using the Proton Irradiation Facility at TRIUMF. The saturation cross-section and threshold energy were determined t...

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Detalles Bibliográficos
Autores principales: Buchanan, N J, Gingrich, D M
Lenguaje:eng
Publicado: 2001
Materias:
Acceso en línea:http://cds.cern.ch/record/684188
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author Buchanan, N J
Gingrich, D M
author_facet Buchanan, N J
Gingrich, D M
author_sort Buchanan, N J
collection CERN
description We have measured the proton induced single-event upset cross-section of a Xilinx SRAM-based FPGA. Six XC4036XLA parts were irradiated with protons of energy between 18~MeV and 105~MeV using the Proton Irradiation Facility at TRIUMF. The saturation cross-section and threshold energy were determined to be (2.7~$\pm$~0.2)$\times$10$^{-9}$~upset$\cdot$cm$^2$/device and (22~$\pm$~2)~MeV, respectively. Based on the behaviour of our test circuit, we have estimated the single-event upset cross-section for the circuit logic and the configuration switches of the FPGA separately. The upset cross-section was used to estimate the single-event upset rate in the ATLAS environment. An estimate of the proton induced latch-up rate in ATLAS was also made.
id cern-684188
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2001
record_format invenio
spelling cern-6841882019-09-30T06:29:59Zhttp://cds.cern.ch/record/684188engBuchanan, N JGingrich, D MProton Induced Radiation Effects on a Xilinx FPGA and Estimates of SEE in the ATLAS EnvironmentDetectors and Experimental TechniquesWe have measured the proton induced single-event upset cross-section of a Xilinx SRAM-based FPGA. Six XC4036XLA parts were irradiated with protons of energy between 18~MeV and 105~MeV using the Proton Irradiation Facility at TRIUMF. The saturation cross-section and threshold energy were determined to be (2.7~$\pm$~0.2)$\times$10$^{-9}$~upset$\cdot$cm$^2$/device and (22~$\pm$~2)~MeV, respectively. Based on the behaviour of our test circuit, we have estimated the single-event upset cross-section for the circuit logic and the configuration switches of the FPGA separately. The upset cross-section was used to estimate the single-event upset rate in the ATLAS environment. An estimate of the proton induced latch-up rate in ATLAS was also made.ATL-LARG-2001-011oai:cds.cern.ch:6841882001-04-24
spellingShingle Detectors and Experimental Techniques
Buchanan, N J
Gingrich, D M
Proton Induced Radiation Effects on a Xilinx FPGA and Estimates of SEE in the ATLAS Environment
title Proton Induced Radiation Effects on a Xilinx FPGA and Estimates of SEE in the ATLAS Environment
title_full Proton Induced Radiation Effects on a Xilinx FPGA and Estimates of SEE in the ATLAS Environment
title_fullStr Proton Induced Radiation Effects on a Xilinx FPGA and Estimates of SEE in the ATLAS Environment
title_full_unstemmed Proton Induced Radiation Effects on a Xilinx FPGA and Estimates of SEE in the ATLAS Environment
title_short Proton Induced Radiation Effects on a Xilinx FPGA and Estimates of SEE in the ATLAS Environment
title_sort proton induced radiation effects on a xilinx fpga and estimates of see in the atlas environment
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/684188
work_keys_str_mv AT buchanannj protoninducedradiationeffectsonaxilinxfpgaandestimatesofseeintheatlasenvironment
AT gingrichdm protoninducedradiationeffectsonaxilinxfpgaandestimatesofseeintheatlasenvironment