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Optimising the Grouping of Wafers in SCT Readout Buffers using Simulated Annealing Methods
| Autor principal: | |
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| Lenguaje: | eng |
| Publicado: |
1996
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/685771 |
| _version_ | 1780901574239846400 |
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| author | Charlton, VA |
| author_facet | Charlton, VA |
| author_sort | Charlton, VA |
| collection | CERN |
| id | cern-685771 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1996 |
| record_format | invenio |
| spelling | cern-6857712019-09-30T06:29:59Zhttp://cds.cern.ch/record/685771engCharlton, VAOptimising the Grouping of Wafers in SCT Readout Buffers using Simulated Annealing MethodsDetectors and Experimental TechniquesATL-DAQ-96-052ATL-D-PN-52oai:cds.cern.ch:6857711996-05-23 |
| spellingShingle | Detectors and Experimental Techniques Charlton, VA Optimising the Grouping of Wafers in SCT Readout Buffers using Simulated Annealing Methods |
| title | Optimising the Grouping of Wafers in SCT Readout Buffers using Simulated Annealing Methods |
| title_full | Optimising the Grouping of Wafers in SCT Readout Buffers using Simulated Annealing Methods |
| title_fullStr | Optimising the Grouping of Wafers in SCT Readout Buffers using Simulated Annealing Methods |
| title_full_unstemmed | Optimising the Grouping of Wafers in SCT Readout Buffers using Simulated Annealing Methods |
| title_short | Optimising the Grouping of Wafers in SCT Readout Buffers using Simulated Annealing Methods |
| title_sort | optimising the grouping of wafers in sct readout buffers using simulated annealing methods |
| topic | Detectors and Experimental Techniques |
| url | http://cds.cern.ch/record/685771 |
| work_keys_str_mv | AT charltonva optimisingthegroupingofwafersinsctreadoutbuffersusingsimulatedannealingmethods |