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Optimising the Grouping of Wafers in SCT Readout Buffers using Simulated Annealing Methods

Detalles Bibliográficos
Autor principal:	Charlton, VA
Lenguaje:	eng
Publicado:	1996
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/685771

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