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Temperature Dependence of Reverse Annealing in Bulk Damaged Silicon
| Autores principales: | , , , |
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| Lenguaje: | eng |
| Publicado: |
1994
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/685912 |
| _version_ | 1780901603746775040 |
|---|---|
| author | Beck, G Gibson, M Pritchard, T W Robinson, D |
| author_facet | Beck, G Gibson, M Pritchard, T W Robinson, D |
| author_sort | Beck, G |
| collection | CERN |
| id | cern-685912 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1994 |
| record_format | invenio |
| spelling | cern-6859122019-09-30T06:29:59Zhttp://cds.cern.ch/record/685912engBeck, GGibson, MPritchard, T WRobinson, DTemperature Dependence of Reverse Annealing in Bulk Damaged SiliconDetectors and Experimental TechniquesATL-INDET-94-071ATL-I-PN-71oai:cds.cern.ch:6859121994-11-16 |
| spellingShingle | Detectors and Experimental Techniques Beck, G Gibson, M Pritchard, T W Robinson, D Temperature Dependence of Reverse Annealing in Bulk Damaged Silicon |
| title | Temperature Dependence of Reverse Annealing in Bulk Damaged Silicon |
| title_full | Temperature Dependence of Reverse Annealing in Bulk Damaged Silicon |
| title_fullStr | Temperature Dependence of Reverse Annealing in Bulk Damaged Silicon |
| title_full_unstemmed | Temperature Dependence of Reverse Annealing in Bulk Damaged Silicon |
| title_short | Temperature Dependence of Reverse Annealing in Bulk Damaged Silicon |
| title_sort | temperature dependence of reverse annealing in bulk damaged silicon |
| topic | Detectors and Experimental Techniques |
| url | http://cds.cern.ch/record/685912 |
| work_keys_str_mv | AT beckg temperaturedependenceofreverseannealinginbulkdamagedsilicon AT gibsonm temperaturedependenceofreverseannealinginbulkdamagedsilicon AT pritchardtw temperaturedependenceofreverseannealinginbulkdamagedsilicon AT robinsond temperaturedependenceofreverseannealinginbulkdamagedsilicon |