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Temperature Dependence of Reverse Annealing in Bulk Damaged Silicon

Detalles Bibliográficos
Autores principales:	Beck, G, Gibson, M, Pritchard, T W, Robinson, D
Lenguaje:	eng
Publicado:	1994
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/685912

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