First evaluation of neutron induced Single Events Effect on the CMS barrel muon electronics

Neutron irradiation tests of the currently available electronics for the CMS barrel muon detector were performed using Thermal and fast neutrons at E< 11MeV. The Single Event Upset rate on the Static RAM was measured, while upper limits are derived for events having experienced no failure. Th...

Descripción completa

Detalles Bibliográficos
Autores principales: Agosteo, S, Castellani, Lorenzo, D'Angelo, G, Favalli, A, Lippi, Ivano, Martinelli, Roberto, Zotto, Pierluigi
Lenguaje:eng
Publicado: 2000
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/687223

Internet

http://cds.cern.ch/record/687223

Ejemplares similares