First evaluation of neutron induced Single Events Effect on the CMS barrel muon electronics

Neutron irradiation tests of the currently available electronics for the CMS barrel muon detector were performed using Thermal and fast neutrons at E< 11MeV. The Single Event Upset rate on the Static RAM was measured, while upper limits are derived for events having experienced no failure. Th...

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Detalles Bibliográficos
Autores principales: Agosteo, S, Castellani, Lorenzo, D'Angelo, G, Favalli, A, Lippi, Ivano, Martinelli, Roberto, Zotto, Pierluigi
Lenguaje:eng
Publicado: 2000
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/687223
Descripción
Sumario:Neutron irradiation tests of the currently available electronics for the CMS barrel muon detector were performed using Thermal and fast neutrons at E< 11MeV. The Single Event Upset rate on the Static RAM was measured, while upper limits are derived for events having experienced no failure. The results are used to guess the upper limits on the mean time between failures in the whole barrel muon detector.

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