First evaluation of neutron induced Single Events Effect on the CMS barrel muon electronics

Neutron irradiation tests of the currently available electronics for the CMS barrel muon detector were performed using Thermal and fast neutrons at E< 11MeV. The Single Event Upset rate on the Static RAM was measured, while upper limits are derived for events having experienced no failure. Th...

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Detalles Bibliográficos
Autores principales: Agosteo, S, Castellani, Lorenzo, D'Angelo, G, Favalli, A, Lippi, Ivano, Martinelli, Roberto, Zotto, Pierluigi
Lenguaje:eng
Publicado: 2000
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/687223
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author Agosteo, S
Castellani, Lorenzo
D'Angelo, G
Favalli, A
Lippi, Ivano
Martinelli, Roberto
Zotto, Pierluigi
author_facet Agosteo, S
Castellani, Lorenzo
D'Angelo, G
Favalli, A
Lippi, Ivano
Martinelli, Roberto
Zotto, Pierluigi
author_sort Agosteo, S
collection CERN
description Neutron irradiation tests of the currently available electronics for the CMS barrel muon detector were performed using Thermal and fast neutrons at E< 11MeV. The Single Event Upset rate on the Static RAM was measured, while upper limits are derived for events having experienced no failure. The results are used to guess the upper limits on the mean time between failures in the whole barrel muon detector.
id cern-687223
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2000
record_format invenio
spelling cern-6872232019-09-30T06:29:59Zhttp://cds.cern.ch/record/687223engAgosteo, SCastellani, LorenzoD'Angelo, GFavalli, ALippi, IvanoMartinelli, RobertoZotto, PierluigiFirst evaluation of neutron induced Single Events Effect on the CMS barrel muon electronicsDetectors and Experimental TechniquesNeutron irradiation tests of the currently available electronics for the CMS barrel muon detector were performed using Thermal and fast neutrons at E< 11MeV. The Single Event Upset rate on the Static RAM was measured, while upper limits are derived for events having experienced no failure. The results are used to guess the upper limits on the mean time between failures in the whole barrel muon detector.CMS-NOTE-2000-024oai:cds.cern.ch:6872232000-03-08
spellingShingle Detectors and Experimental Techniques
Agosteo, S
Castellani, Lorenzo
D'Angelo, G
Favalli, A
Lippi, Ivano
Martinelli, Roberto
Zotto, Pierluigi
First evaluation of neutron induced Single Events Effect on the CMS barrel muon electronics
title First evaluation of neutron induced Single Events Effect on the CMS barrel muon electronics
title_full First evaluation of neutron induced Single Events Effect on the CMS barrel muon electronics
title_fullStr First evaluation of neutron induced Single Events Effect on the CMS barrel muon electronics
title_full_unstemmed First evaluation of neutron induced Single Events Effect on the CMS barrel muon electronics
title_short First evaluation of neutron induced Single Events Effect on the CMS barrel muon electronics
title_sort first evaluation of neutron induced single events effect on the cms barrel muon electronics
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/687223
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