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First evaluation of neutron induced Single Events Effect on the CMS barrel muon electronics
Neutron irradiation tests of the currently available electronics for the CMS barrel muon detector were performed using Thermal and fast neutrons at E< 11MeV. The Single Event Upset rate on the Static RAM was measured, while upper limits are derived for events having experienced no failure. Th...
Autores principales: | Agosteo, S, Castellani, Lorenzo, D'Angelo, G, Favalli, A, Lippi, Ivano, Martinelli, Roberto, Zotto, Pierluigi |
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Lenguaje: | eng |
Publicado: |
2000
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/687223 |
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