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Temperature Dependence of the Behaviour of a Single-Sided Irradiated Silicon Detector
We have studied the behaviour of a single-sided, 50 micron pitch, AC-coupled, poly-resistor biased silicon detector, processed at CSEM ( Neuchatel, Switzerland) after having been irradiated with a fluence of 10^13 neutrons/cm2 . The irradiation has been performed simulating the CMS silicon tracker d...
Autores principales: | Babucci, Ezio, Bartalini, Paolo, Bilei, Gian Mario, Bizzaglia, Sauro, Checcucci, Bruno, Dinu, Nicoleta, Lariccia, Paolo, Mantovani, Giancarlo, Postolache, Vasile, Santocchia, Attilio, Servoli, Leonello, Wang, Yefa |
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Lenguaje: | eng |
Publicado: |
1998
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/687507 |
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