A detailed study of charge diffusion and its effect on spatial resolution in Silicon Drift Detectors, pt.1

Detalles Bibliográficos
Autores principales: Nouais, D, Cerello, P G, Crescio, E
Lenguaje:eng
Publicado: 2001
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/689048

Internet

http://cds.cern.ch/record/689048

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