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Reflected Light Monitor for Multi-point Position Measurements
A new semitransparent straightness monitor for high-precision control of the spatial displacements is described. The monitor combines the properties of a thin semitransparent mirror and a segmented photodiode sensor. Laboratory measurements with a prototype monitor show that a position resolution of...
Autores principales: | , , , |
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Lenguaje: | eng |
Publicado: |
1999
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/689060 |