Quality Tests of Double-Sided Silicon Strip Detectors

The quality of the SiO2 insulator (AC coupling between metal and implanted strips) of double-sided Silicon strip detectors has been studied by using a probe station. Some tests performed on 23 wafers are described and the results are discussed. <br> <h2>Remark</h2> This note seems...

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Detalles Bibliográficos
Autores principales: Cambon, T, Coffin, J P, Fintz, P, Guillaume, G, Jundt, F, Kuhn, C, Lutz, Jean Robert, Pagès, P, Pozdniakov, S, Rami, F, Sparavec, K, Dulinski, W, Arnold, L
Lenguaje:eng
Publicado: 1997
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/689230
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author Cambon, T
Coffin, J P
Fintz, P
Guillaume, G
Jundt, F
Kuhn, C
Lutz, Jean Robert
Pagès, P
Pozdniakov, S
Rami, F
Sparavec, K
Dulinski, W
Arnold, L
author_facet Cambon, T
Coffin, J P
Fintz, P
Guillaume, G
Jundt, F
Kuhn, C
Lutz, Jean Robert
Pagès, P
Pozdniakov, S
Rami, F
Sparavec, K
Dulinski, W
Arnold, L
author_sort Cambon, T
collection CERN
description The quality of the SiO2 insulator (AC coupling between metal and implanted strips) of double-sided Silicon strip detectors has been studied by using a probe station. Some tests performed on 23 wafers are described and the results are discussed. <br> <h2>Remark</h2> This note seems to cause problems with ghostview but it can be printed without any problem.
id cern-689230
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 1997
record_format invenio
spelling cern-6892302019-09-30T06:29:59Zhttp://cds.cern.ch/record/689230engCambon, TCoffin, J PFintz, PGuillaume, GJundt, FKuhn, CLutz, Jean RobertPagès, PPozdniakov, SRami, FSparavec, KDulinski, WArnold, LQuality Tests of Double-Sided Silicon Strip DetectorsDetectors and Experimental TechniquesThe quality of the SiO2 insulator (AC coupling between metal and implanted strips) of double-sided Silicon strip detectors has been studied by using a probe station. Some tests performed on 23 wafers are described and the results are discussed. <br> <h2>Remark</h2> This note seems to cause problems with ghostview but it can be printed without any problem.ALICE-INT-1997-30CERN-ALICE-INT-1997-30oai:cds.cern.ch:6892301997
spellingShingle Detectors and Experimental Techniques
Cambon, T
Coffin, J P
Fintz, P
Guillaume, G
Jundt, F
Kuhn, C
Lutz, Jean Robert
Pagès, P
Pozdniakov, S
Rami, F
Sparavec, K
Dulinski, W
Arnold, L
Quality Tests of Double-Sided Silicon Strip Detectors
title Quality Tests of Double-Sided Silicon Strip Detectors
title_full Quality Tests of Double-Sided Silicon Strip Detectors
title_fullStr Quality Tests of Double-Sided Silicon Strip Detectors
title_full_unstemmed Quality Tests of Double-Sided Silicon Strip Detectors
title_short Quality Tests of Double-Sided Silicon Strip Detectors
title_sort quality tests of double-sided silicon strip detectors
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/689230
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