TCS defect level in silicon produced by irradiation with muons of GeV-energy

Detalles Bibliográficos
Autores principales: Heijne, Erik H M, Müller, J C, Siffert, P
Lenguaje:eng
Publicado: 1975
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/699655

Internet

http://cds.cern.ch/record/699655

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