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TCS defect level in silicon produced by irradiation with muons of GeV-energy

Detalles Bibliográficos
Autores principales:	Heijne, Erik H M, Müller, J C, Siffert, P
Lenguaje:	eng
Publicado:	1975
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/699655

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