Software Evaluation and Irradiation Test of the SBS Technologies Model 620 PCI-to-VME Bus Adapter

Detalles Bibliográficos
Autores principales: Matveev, M, Padley, P, Pawloski, G, Roberts, J, Tripathi, M M
Lenguaje:eng
Publicado: CERN 2003
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.5170/CERN-2003-006.389
http://cds.cern.ch/record/722107

Internet

https://dx.doi.org/10.5170/CERN-2003-006.389
http://cds.cern.ch/record/722107

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