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Fixed pattern deviations in Si pixel detectors measured using the Medipix 1 readout chip
Dopant fluctuations and other defects in silicon wafers can lead to systematic errors in several parameters in particle or single-photon detection. In imaging applications non-uniformities in sensors or readout give rise to fixed pattern image noise and degradation of achievable spatial resolution f...
| Autores principales: | , , , , |
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| Lenguaje: | eng |
| Publicado: |
2003
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1016/S0168-9002(03)01557-2 http://cds.cern.ch/record/725908 |