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Total dose radiation failure probability of bipolar transistors
The failure probability P sub F related with gamma total dose radiation is presented for three bipolar transistor 3DK9D, 3DG6D and 3DG4C. It is shown that the P sub F -D relation is well depicted by Weibull function. h sub F sub E (D)/h sub F sub E (0)=80%, 70% and 50% was taken as the failure crite...
| Autores principales: | , |
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| Lenguaje: | chi |
| Publicado: |
2002
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/747266 |