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Results of irradiation tests on standard planar silicon detectors with 7-10 MeV protons
Standard planar silicon detectors of 2 k OMEGA cm resistivity were irradiated with 7-10 MeV protons up to fluences of 7x10 sup 1 sup 3 p/cm sup 2. The effects of proton irradiation on the effective doping concentration (N sub e sub f sub f) and leakage current (I sub v sub o sub l) as a function of...
Autores principales: | Bechevet, D, Glaser, M, Houdayer, A, Lebel, C, Leroy, C, Moll, Michael, Roy, P |
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Lenguaje: | eng |
Publicado: |
2002
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/772351 |
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