Results of radiation test of the cathode front-end board for CMS endcap muon chambers

Mostrar otras versiones (1)

After a brief overview of the CMS EMU electronics system, results on radiation induced single event effects, total ionization dose and displacement effects will be reported. These results are obtained by irradiating the components on electronics boards with 63 MeV protons and 1 MeV neutrons. During...

Descripción completa

Detalles Bibliográficos
Autores principales: Breedon, R, Bylsma, B, Durkin, L S, Gilmore, J, Gu, J, Hauser, J, Holbrook, B, Kim, C L, Ling, T, Mey, M, Murray, P, Rush, C J, Santiard, Jean-Claude, Tripathi, M
Lenguaje:eng
Publicado: 2001
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/S0168-9002(01)00857-9
http://cds.cern.ch/record/781473

Internet

https://dx.doi.org/10.1016/S0168-9002(01)00857-9
http://cds.cern.ch/record/781473

Ejemplares similares