Cargando…
Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker
Autor principal: | |
---|---|
Lenguaje: | eng |
Publicado: |
2004
|
Materias: | |
Acceso en línea: | https://dx.doi.org/10.1016/j.nima.2004.05.046 http://cds.cern.ch/record/797977 |