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Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker
| Autor principal: | |
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| Lenguaje: | eng |
| Publicado: |
2004
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1016/j.nima.2004.05.046 http://cds.cern.ch/record/797977 |
| _version_ | 1780904691229523968 |
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| author | De Filippis, N |
| author_facet | De Filippis, N |
| author_sort | De Filippis, N |
| collection | CERN |
| id | cern-797977 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2004 |
| record_format | invenio |
| spelling | cern-7979772019-09-30T06:29:59Zdoi:10.1016/j.nima.2004.05.046http://cds.cern.ch/record/797977engDe Filippis, NTest beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip TrackerDetectors and Experimental Techniquesoai:cds.cern.ch:7979772004 |
| spellingShingle | Detectors and Experimental Techniques De Filippis, N Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker |
| title | Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker |
| title_full | Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker |
| title_fullStr | Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker |
| title_full_unstemmed | Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker |
| title_short | Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker |
| title_sort | test beam analysis of the effect of highly ionizing particles on the cms silicon strip tracker |
| topic | Detectors and Experimental Techniques |
| url | https://dx.doi.org/10.1016/j.nima.2004.05.046 http://cds.cern.ch/record/797977 |
| work_keys_str_mv | AT defilippisn testbeamanalysisoftheeffectofhighlyionizingparticlesonthecmssiliconstriptracker |