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Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker

Detalles Bibliográficos
Autor principal: De Filippis, N
Lenguaje:eng
Publicado: 2004
Materias:
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2004.05.046
http://cds.cern.ch/record/797977
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author De Filippis, N
author_facet De Filippis, N
author_sort De Filippis, N
collection CERN
id cern-797977
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2004
record_format invenio
spelling cern-7979772019-09-30T06:29:59Zdoi:10.1016/j.nima.2004.05.046http://cds.cern.ch/record/797977engDe Filippis, NTest beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip TrackerDetectors and Experimental Techniquesoai:cds.cern.ch:7979772004
spellingShingle Detectors and Experimental Techniques
De Filippis, N
Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker
title Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker
title_full Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker
title_fullStr Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker
title_full_unstemmed Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker
title_short Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker
title_sort test beam analysis of the effect of highly ionizing particles on the cms silicon strip tracker
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1016/j.nima.2004.05.046
http://cds.cern.ch/record/797977
work_keys_str_mv AT defilippisn testbeamanalysisoftheeffectofhighlyionizingparticlesonthecmssiliconstriptracker