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Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker
Autor principal: | |
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Lenguaje: | eng |
Publicado: |
2004
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1016/j.nima.2004.05.046 http://cds.cern.ch/record/797977 |
_version_ | 1780904691229523968 |
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author | De Filippis, N |
author_facet | De Filippis, N |
author_sort | De Filippis, N |
collection | CERN |
id | cern-797977 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2004 |
record_format | invenio |
spelling | cern-7979772019-09-30T06:29:59Zdoi:10.1016/j.nima.2004.05.046http://cds.cern.ch/record/797977engDe Filippis, NTest beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip TrackerDetectors and Experimental Techniquesoai:cds.cern.ch:7979772004 |
spellingShingle | Detectors and Experimental Techniques De Filippis, N Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker |
title | Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker |
title_full | Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker |
title_fullStr | Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker |
title_full_unstemmed | Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker |
title_short | Test beam analysis of the effect of highly ionizing particles on the CMS Silicon Strip Tracker |
title_sort | test beam analysis of the effect of highly ionizing particles on the cms silicon strip tracker |
topic | Detectors and Experimental Techniques |
url | https://dx.doi.org/10.1016/j.nima.2004.05.046 http://cds.cern.ch/record/797977 |
work_keys_str_mv | AT defilippisn testbeamanalysisoftheeffectofhighlyionizingparticlesonthecmssiliconstriptracker |