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Response of the APV readout chip to laser-simulated, highly ionizing interactions
Heavily Ionizing Particles are know to cause sizable dead-time in the front end APV chip of the CMS Silicon Strip Tracker. To better understand this behavior, the effects of Highly Ionizing Particles in the CMS Silicon Strip Tracker were simulated using a 1060 nm laser. Calibrated laser pulses allow...
| Autores principales: | , , , |
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| Lenguaje: | eng |
| Publicado: |
2004
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/801155 |