Simulation of Heavily Irradiated Silicon Pixel Sensors and Comparison with Test Beam Measurements

Charge collection measurements performed on heavily irradiated p-spray DOFZ pixel sensors with a grazing angle hadron beam provide a sensitive determination of the electric field within the detectors. The data are compared with a complete charge transport simulation of the sensor which includes sign...

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Detalles Bibliográficos
Autores principales: Chiochia, Vincenzo, Swartz, Morris, Bortoletto, Daniela, Cremaldi, Lucien, Cucciarelli, Susanna, Dorokhov, Andrei, Hoermann, Christoph, Kim, Dongwook, Konecki, Marcin, Kotlinski, Danek, Prokofiev, Kirill, Regenfus, Christian, Rohe, Tilman, Sanders, David A., Son, Seunghee, Speer, Thomas
Lenguaje:eng
Publicado: 2004
Materias:
Other Fields of Physics
Acceso en línea:https://dx.doi.org/10.1109/TNS.2005.852748
https://dx.doi.org/10.1109/NSSMIC.2004.1462427
http://cds.cern.ch/record/804214

Internet

https://dx.doi.org/10.1109/TNS.2005.852748
https://dx.doi.org/10.1109/NSSMIC.2004.1462427
http://cds.cern.ch/record/804214

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