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Radiation Damage Measurements on ALEPH Double-Sided Silicon Strip Test Structures

Detalles Bibliográficos
Autores principales:	Johnson, R, Rennels, R
Lenguaje:	eng
Publicado:	1994
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/806021

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