SEU rate estimates for the ATLAS/SCT front-end ASIC

We present a method of estimating the sensitivity to radiation- induced Single Event Upset (SEU) in the front-end ASICs for the ATLAS Semiconductor Tracker. The method is using ASICs of the final design with limited read-back possibilities of internal registers. Hence the measurement is adapted to u...

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Detalles Bibliográficos
Autores principales: Eklund, L, Buttar, C, Grigson, C, Kramberger, G, Mandic, I, Mikuz, M, Phillips, P
Lenguaje:eng
Publicado: 2003
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2003.07.003
http://cds.cern.ch/record/807997

Internet

https://dx.doi.org/10.1016/j.nima.2003.07.003
http://cds.cern.ch/record/807997

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