SEU rate estimates for the ATLAS/SCT front-end ASIC

We present a method of estimating the sensitivity to radiation- induced Single Event Upset (SEU) in the front-end ASICs for the ATLAS Semiconductor Tracker. The method is using ASICs of the final design with limited read-back possibilities of internal registers. Hence the measurement is adapted to u...

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Detalles Bibliográficos
Autores principales: Eklund, L, Buttar, C, Grigson, C, Kramberger, G, Mandic, I, Mikuz, M, Phillips, P
Lenguaje:eng
Publicado: 2003
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2003.07.003
http://cds.cern.ch/record/807997
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author Eklund, L
Buttar, C
Grigson, C
Kramberger, G
Mandic, I
Mikuz, M
Phillips, P
author_facet Eklund, L
Buttar, C
Grigson, C
Kramberger, G
Mandic, I
Mikuz, M
Phillips, P
author_sort Eklund, L
collection CERN
description We present a method of estimating the sensitivity to radiation- induced Single Event Upset (SEU) in the front-end ASICs for the ATLAS Semiconductor Tracker. The method is using ASICs of the final design with limited read-back possibilities of internal registers. Hence the measurement is adapted to utilise the event-data flow in the digital part of the ASIC to detect bit-flips. Furthermore, we report on the application of this method to estimate the SEU sensitivity. The results presented are based on data from three irradiation periods using prototype electronics hybrids and detector modules. The measurements were done with 24 GeV/c protons and 200 MeV/c pions.
id cern-807997
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2003
record_format invenio
spelling cern-8079972019-09-30T06:29:59Zdoi:10.1016/j.nima.2003.07.003http://cds.cern.ch/record/807997engEklund, LButtar, CGrigson, CKramberger, GMandic, IMikuz, MPhillips, PSEU rate estimates for the ATLAS/SCT front-end ASICDetectors and Experimental TechniquesWe present a method of estimating the sensitivity to radiation- induced Single Event Upset (SEU) in the front-end ASICs for the ATLAS Semiconductor Tracker. The method is using ASICs of the final design with limited read-back possibilities of internal registers. Hence the measurement is adapted to utilise the event-data flow in the digital part of the ASIC to detect bit-flips. Furthermore, we report on the application of this method to estimate the SEU sensitivity. The results presented are based on data from three irradiation periods using prototype electronics hybrids and detector modules. The measurements were done with 24 GeV/c protons and 200 MeV/c pions.oai:cds.cern.ch:8079972003
spellingShingle Detectors and Experimental Techniques
Eklund, L
Buttar, C
Grigson, C
Kramberger, G
Mandic, I
Mikuz, M
Phillips, P
SEU rate estimates for the ATLAS/SCT front-end ASIC
title SEU rate estimates for the ATLAS/SCT front-end ASIC
title_full SEU rate estimates for the ATLAS/SCT front-end ASIC
title_fullStr SEU rate estimates for the ATLAS/SCT front-end ASIC
title_full_unstemmed SEU rate estimates for the ATLAS/SCT front-end ASIC
title_short SEU rate estimates for the ATLAS/SCT front-end ASIC
title_sort seu rate estimates for the atlas/sct front-end asic
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1016/j.nima.2003.07.003
http://cds.cern.ch/record/807997
work_keys_str_mv AT eklundl seurateestimatesfortheatlassctfrontendasic
AT buttarc seurateestimatesfortheatlassctfrontendasic
AT grigsonc seurateestimatesfortheatlassctfrontendasic
AT krambergerg seurateestimatesfortheatlassctfrontendasic
AT mandici seurateestimatesfortheatlassctfrontendasic
AT mikuzm seurateestimatesfortheatlassctfrontendasic
AT phillipsp seurateestimatesfortheatlassctfrontendasic

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