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Infrared ellipsometry on semiconductor layer structures: phonons, plasmons, and polaritons
The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It desc...
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| Lenguaje: | eng |
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Springer
2004
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| Acceso en línea: | https://dx.doi.org/10.1007/b11964 http://cds.cern.ch/record/809768 |