The CMS ECAL Very Front End Electronics Production and Test

Detalles Bibliográficos
Autores principales: Biino, C, Combaret, C, Dejardin, M, Djambazov, L, Dröge, M, Hansen, M, Lustermann, W, Menichetti, E, Nardulli, A, Nash, J, Nervo, M, Obertino, M, Pastrone, N
Lenguaje:eng
Publicado: CERN 2004
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.5170/CERN-2004-010.107
http://cds.cern.ch/record/814039

Internet

https://dx.doi.org/10.5170/CERN-2004-010.107
http://cds.cern.ch/record/814039

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