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Performance and limitations of high granularity single photon processing X-ray imaging detectors
Progress in CMOS technology and in fine pitch bump bonding has made possible the development of single photon counting detectors for X-ray imaging with pixel pitches on the order of 50 µm giving a spatial resolution which is comparable to conventional CCD and flat panel detectors. This thesis studie...
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| Lenguaje: | eng |
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Vienna, Tech. U.
2005
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| Acceso en línea: | http://cds.cern.ch/record/846447 |